RockDawg Posted October 11, 2008 Share Posted October 11, 2008 I've been using Joe L.'s wonderful unMenu and after perusing the SMART statistics I noticed one drive looks a little funky. The report shows errors, but says the drive passed "SMART overall-health self-assessment test". What does this mean and what should I now do (if anything)? Here's the report (sorry, pastebin wouldn't load for me): Statistics for /dev/sdi SAMSUNG_HD400LJ_S0H2J1KLA07194 smartctl version 5.36 [i486-slackware-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG HD400LJ Serial Number: S0H2J1KLA07194 Firmware Version: ZZ100-15 User Capacity: 400,088,457,216 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Sat Oct 11 19:21:23 2008 GMT+4 ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x05) Offline data collection activity was aborted by an interrupting command from host. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (7575) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 129) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 253 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always - 8000 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 776 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 8045 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 112 190 Unknown_Attribute 0x0022 082 072 000 Old_age Always - 18 194 Temperature_Celsius 0x0022 184 154 000 Old_age Always - 18 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 67880 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 253 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 100 000 Old_age Always - 0 202 TA_Increase_Count 0x0032 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 41 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 41 occurred at disk power-on lifetime: 4069 hours (169 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 08 cf 04 00 40 Error: ICRC, ABRT 8 sectors at LBA = 0x000004cf = 1231 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 cf 04 00 40 00 19d+23:19:36.250 READ DMA Error 40 occurred at disk power-on lifetime: 4068 hours (169 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 08 57 00 00 40 Error: ICRC, ABRT 8 sectors at LBA = 0x00000057 = 87 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 57 00 00 40 00 19d+22:55:44.188 READ DMA Error 39 occurred at disk power-on lifetime: 4068 hours (169 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 08 57 00 00 40 Error: ICRC, ABRT 8 sectors at LBA = 0x00000057 = 87 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 57 00 00 40 00 19d+22:55:44.125 READ DMA Error 38 occurred at disk power-on lifetime: 4068 hours (169 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 08 57 00 00 40 Error: ICRC, ABRT 8 sectors at LBA = 0x00000057 = 87 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 57 00 00 40 00 19d+22:55:44.063 READ DMA Error 37 occurred at disk power-on lifetime: 4068 hours (169 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 08 57 00 00 40 Error: ICRC, ABRT 8 sectors at LBA = 0x00000057 = 87 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 57 00 00 40 00 19d+22:55:44.000 READ DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. Quote Link to comment
WeeboTech Posted October 11, 2008 Share Posted October 11, 2008 compare the poweron hours to the hours when this error occured and you will see it's quite a while ago. I looks as though there was a communication error during a direct memory transfer. Those errors are not significant at the current time. I did not see any reallocated sectors nor any pending sectors. if you do a short test I'm sure it will pass. Quote Link to comment
RockDawg Posted October 11, 2008 Author Share Posted October 11, 2008 Those aren't the results of a short test? Quote Link to comment
WeeboTech Posted October 11, 2008 Share Posted October 11, 2008 Those aren't the results of a short test? No they are transient errors during a prior timeframe that were logged into tht rotating error log SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] shows no tests were run yet. it should look similar to this SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 3550 - # 2 Short offline Completed without error 00% 2454 - # 3 Extended offline Completed without error 00% 807 - # 4 Short offline Completed without error 00% 234 - Quote Link to comment
RockDawg Posted October 12, 2008 Author Share Posted October 12, 2008 Hmmm. That SMART test log doesn't change. I just ran a short test via unmenu, waited 3 minutes, and checked the statistics again, and it still shows no tests logged. Quote Link to comment
RockDawg Posted October 12, 2008 Author Share Posted October 12, 2008 Also, unmenu says, "SMART reports and tests will spin up the drive.", but if I go into the web gui for my server and spin down all the drives and then click on a short test in unmenu and then repeatedly hit refresh on the web gui, no drives ever show as spinning up. Something must be wrong in unmenu? Quote Link to comment
WeeboTech Posted October 12, 2008 Share Posted October 12, 2008 There might be something with unmenu or the version of smartctl and how it communicates with the drive. I think the newer version of smartctl is going to be included in the update. Quote Link to comment
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