WD 4TB WD Red SATA 3.5" Internal HDD (WD40EFRX) $140 + FS! (eBay Daily Deal)


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Been a member since 2013, only ~1800 feedback, but was selling 1400 hard drives for super cheap.  Personally, I was just concerned whether or not I would get it/them.

 

~$182,000 in sales with that one auction, hoping all goes well for the buyers.  I wasn't man enough to try it. <grin>

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Been a member since 2013, only ~1800 feedback, but was selling 1400 hard drives for super cheap.  Personally, I was just concerned whether or not I would get it/them.

 

~$182,000 in sales with that one auction, hoping all goes well for the buyers.  I wasn't man enough to try it. <grin>

 

Cheap but not super cheap. I've gotten 4T for as little as $129. And this is not from a store - so if you get a defective one I'm not sure you get an easy replacement like with Newegg or B&H. You might be shipping back to WD to get a refurb.

 

BTW, B&H is my new fav for hard disks. Their prices are often a few dollars cheaper than Newegg or Amazon, and I like to support the smaller guys to try to encourage the competition. They have no restocking fees like Newegg from what I can see.

 

They have the 5T Seagate external for $196.  A little more per T than 4Ts, but hey the extra density is worth a few extra bucks to me. Hoping I don't get a dud - which is the risk with an external, but bit for one to try it out. (I have a RAID card for parity and with 2 3T drives in there I can create a 5T parity from them.) Hoping Seagate starts selling the 5T internals soon.

 

Any advice on testing out a USB3 external drive before cracking it open? I'm not even certain I'll be able to see the smart reports.

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Well my way to preclear a USB3.0 external sounds like it would work but when I tried it the drive always overheated before the preclear would finish.

 

 

My method:  Setup Virtual Box on a Windows box that had USB3.0 port.  RDM the drive to an unRAID VM and run the preclear script on it.  I got speeds about 70MB/s (when it started not the average) so substantially slower.  But it would have been acceptable to me if it had finished.  Problem was the drive got into the high 50s and the preclear failed.  It is possible it wasn't the temperature that caused preclear to fail but that high a temp wasn't good anyway and is what I attribute the failure to.

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The drives shipped out today! Hopefully well packaged. Ground shipping coming from the East coast to the West coast.

 

Excellent.  Really hoping for a great transaction for your sake and, well, to know to put this seller as a favorite to keep an eye out for future goodies.

 

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Got my two today. In an 11"x9"x7" box, drives loose with 13 ( 8"x4") air pouches, only one with air in it.  Anti Static bags pretty dinged up over circuit boards. Not a good sign. Can't check them out until tomorrow. Fingers crossed!

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Got my two today. In an 11"x9"x7" box, drives loose with 13 ( 8"x4") air pouches, only one with air in it.  Anti Static bags pretty dinged up over circuit boards. Not a good sign. Can't check them out until tomorrow. Fingers crossed!

 

Let us know. There are some pics from someone who linked to here from Reddit (http://www.reddit.com/r/DataHoarder/comments/2807jl/this_is_the_worst_packaging_ive_ever_seen_for/)

 

It does not look good, I can't imagine what shipping to the west coast is going to look like. That shipping would warrant a bad review on ebay, and hopefully the drives won't be DOA.

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Looks like people are returning them, and the seller is paying for the shipping back. As noted in the SD thread I wouldn't ask for a replacement as you don't know if they will just re-package someones returned drives.

 

http://slickdeals.net/permadeal/121992/ebay---4tb-western-digital-wd-red-sata-3.5-internal-hard-drive?page=11#comments

 

Edit: I should note I noticed that there were some reviews about the drives in his feedback and they went away so I'm guessing people are returning or opening disputes which I think would remove the ebay feedback.

 

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Maybe I was just lucky but my 3 drives arrived today and they are fine - so far at least.  I would have preferred that they be individually wrapped and then packed in the box but it was adequate.  It was packed with bubble wrap but the bubbles were about 2 inch square and the two drives on the bottom were wrapped up on all sides with it.  The third drive was wrapped by itself.  If they had tapped up the wrapping I would have felt better but none of the bubbles were popped so UPS may have been kind to me as well - although the box did look slightly crushed so it did get SOME shipping abuse by UPS but maybe not a lot.  Just started a 3 cycle preclear on them so Tuesday night to Wednesday I should know if they are OK.

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Maybe I was just lucky but my 3 drives arrived today and they are fine - so far at least.  I would have preferred that they be individually wrapped and then packed in the box but it was adequate.  It was packed with bubble wrap but the bubbles were about 2 inch square and the two drives on the bottom were wrapped up on all sides with it.  The third drive was wrapped by itself.  If they had tapped up the wrapping I would have felt better but none of the bubbles were popped so UPS may have been kind to me as well - although the box did look slightly crushed so it did get SOME shipping abuse by UPS but maybe not a lot.  Just started a 3 cycle preclear on them so Tuesday night to Wednesday I should know if they are OK.

 

Thanks for the update. Keep us posted.

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Just got my drives, the box was pretty beat up. The drives were on top of each other and there are some puncture marks from where they must have rubbed. Some of the bubble wrap was deflated, but the drives don't look as bad as from the images I saw online.

 

Aside from a preclear and running WD tools. Any suggestions on scans to make sure the drives are OK?

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Just got my drives, the box was pretty beat up. The drives were on top of each other and there are some puncture marks from where they must have rubbed. Some of the bubble wrap was deflated, but the drives don't look as bad as from the images I saw online.

 

Aside from a preclear and running WD tools. Any suggestions on scans to make sure the drives are OK?

 

I wouldn't trust those drives with any amount of testing. Return them and get your money back, there will be plenty of other deals.

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Just got my drives, the box was pretty beat up. The drives were on top of each other and there are some puncture marks from where they must have rubbed. Some of the bubble wrap was deflated, but the drives don't look as bad as from the images I saw online.

 

Aside from a preclear and running WD tools. Any suggestions on scans to make sure the drives are OK?

 

I wouldn't trust those drives with any amount of testing. Return them and get your money back, there will be plenty of other deals.

 

Yea that's what I'm starting to think.

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Yea that's what I'm starting to think.

 

I've been seeing (and posting) deals for 4TB drives for $150 or less quite frequently lately, once per week or so.

 

I'm going to go that direction. I contacted them for a refund, and for them to pay for the return shipping. Then the next deal from B&H, Amazon, or Newegg I'm going to jump on.

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I will see what my drives are like tonight.  The three cycle preclear should have finished by now and the last time I got smart reports on them they were fine.  My packaging was also fine when I got it.  The packaging gods must have been smiling on me.

 

 

 

 

Yep they were smiling on me.  Here are the final smart reports after 3 cycles on the 3 drives I got:

 

 

Drive1:

Disk: /dev/sda
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net


=== START OF INFORMATION SECTION ===
Device Model:     WDC WD40EFRX-68WT0N0
Serial Number:    WD-WCC4E1854922
Firmware Version: 80.00A80
User Capacity:    4,000,787,030,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   9
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Tue Jun 17 05:59:38 2014 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled


=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED


General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (53280) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 255) minutes.
Conveyance self-test routine
recommended polling time: 	 (   5) minutes.
SCT capabilities: 	       (0x703d)	SCT Status supported.
				SCT Error Recovery Control supported.
				SCT Feature Control supported.
				SCT Data Table supported.


SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   100   253   021    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       2
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   100   253   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       81
10 Spin_Retry_Count        0x0032   100   253   000    Old_age   Always       -       0
11 Calibration_Retry_Count 0x0032   100   253   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       2
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       1
193 Load_Cycle_Count        0x0032   200   200   000    Old_age   Always       -       4
194 Temperature_Celsius     0x0022   125   121   000    Old_age   Always       -       27
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0008   100   253   000    Old_age   Offline      -       0


SMART Error Log Version: 1
No Errors Logged


SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]




SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

 

Drive2:

Disk: /dev/sdc
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net


=== START OF INFORMATION SECTION ===
Device Model:     WDC WD40EFRX-68WT0N0
Serial Number:    WD-WCC4E1858486
Firmware Version: 80.00A80
User Capacity:    4,000,787,030,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   9
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Tue Jun 17 04:50:08 2014 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled


=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED


General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (51060) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 255) minutes.
Conveyance self-test routine
recommended polling time: 	 (   5) minutes.
SCT capabilities: 	       (0x703d)	SCT Status supported.
				SCT Error Recovery Control supported.
				SCT Feature Control supported.
				SCT Data Table supported.


SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   100   253   021    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       2
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   100   253   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       80
10 Spin_Retry_Count        0x0032   100   253   000    Old_age   Always       -       0
11 Calibration_Retry_Count 0x0032   100   253   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       2
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       1
193 Load_Cycle_Count        0x0032   200   200   000    Old_age   Always       -       4
194 Temperature_Celsius     0x0022   124   121   000    Old_age   Always       -       28
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0008   100   253   000    Old_age   Offline      -       0


SMART Error Log Version: 1
No Errors Logged


SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]




SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

 

Drive 3:

Disk: /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net


=== START OF INFORMATION SECTION ===
Device Model:     WDC WD40EFRX-68WT0N0
Serial Number:    WD-WCC4E1858490
Firmware Version: 80.00A80
User Capacity:    4,000,787,030,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   9
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Tue Jun 17 05:31:50 2014 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled


=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED


General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
				was never started.
				Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
				without error or no self-test has ever 
				been run.
Total time to complete Offline 
data collection: 		 (52680) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
				Auto Offline data collection on/off support.
				Suspend Offline collection upon new
				command.
				Offline surface scan supported.
				Self-test supported.
				Conveyance Self-test supported.
				Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
				power-saving mode.
				Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
				General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 255) minutes.
Conveyance self-test routine
recommended polling time: 	 (   5) minutes.
SCT capabilities: 	       (0x703d)	SCT Status supported.
				SCT Error Recovery Control supported.
				SCT Feature Control supported.
				SCT Data Table supported.


SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   100   253   021    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       2
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   100   253   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       81
10 Spin_Retry_Count        0x0032   100   253   000    Old_age   Always       -       0
11 Calibration_Retry_Count 0x0032   100   253   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       2
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       1
193 Load_Cycle_Count        0x0032   200   200   000    Old_age   Always       -       4
194 Temperature_Celsius     0x0022   125   120   000    Old_age   Always       -       27
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0008   100   253   000    Old_age   Offline      -       0


SMART Error Log Version: 1
No Errors Logged


SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]




SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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